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| ОБРАЗ | ЧАСТЬ №. | ЦЕНА | КОЛИЧЕСТВО | АКЦИИ | ПРОИЗВОДСТВО | ОПИСАНИЕ | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-TSSOP | 74LVTH | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers |
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